tests: Update test_config.h for test_analogio_adc.cpp.

Signed-off-by: Frederikwag <frederik.wagner@infineon.com>

Author: Frederikwag

tests/Makefile.test

@@ -40,4 +40,8 @@ make FQBN=arduino-git:xmc:XMC4700_Relax_Kit PORT=/dev/ttyACM0 test_spi_connected
 make FQBN=arduino-git:xmc:XMC4700_Relax_Kit PORT=/dev/ttyACM1 test_spi_connected2_slave monitor
 
 # 1 board, loopback
-make FQBN=arduino-git:xmc:XMC4700_Relax_Kit PORT=/dev/ttyACM0 test_spi_connected1_loopback monitor
+make FQBN=arduino-git:xmc:XMC4700_Relax_Kit PORT=/dev/ttyACM0 test_spi_connected1_loopback 
+
+## AnalogIO
+
+make FQBN=arduino-git:xmc:XMC4700_Relax_Kit PORT=/dev/ttyACM0 test_analogio_adc monitor

tests/test_config.h

@@ -3,17 +3,24 @@
  * @brief Configuration file for board-specific test pin definitions.
  *
  * This header file contains the definitions of the pins used for testing
- * purposes on the specific board. These pins are configured as output and 
- * input pins for various test scenarios.
- *
+ * purposes on the specific board.
  */
- #ifndef TEST_CONFIG_H
- #define TEST_CONFIG_H
- 
- #include <stdint.h>
- 
- // test defines
- const uint8_t TEST_DIGITALIO_OUTPUT = 4;  // IO0
- const uint8_t TEST_DIGITALIO_INPUT = 2;   // IO1
- 
- #endif // TEST_CONFIG_H
+#ifndef TEST_CONFIG_H
+#define TEST_CONFIG_H
+
+#include <stdint.h>
+
+// Digital I/O test pins
+const uint8_t TEST_DIGITALIO_OUTPUT = 4; // IO0
+const uint8_t TEST_DIGITALIO_INPUT = 2;  // IO1
+
+// Analog I/O test pins
+#define TEST_PIN_ANALOG_IO_VREF A0    // Pin connected to VREF
+#define TEST_PIN_ANALOG_IO_DIVIDER A1 // Pin connected to voltage divider
+#define TEST_PIN_ANALOG_IO_GND A2     // Pin connected to GND
+#define TEST_PIN_ANALOG_IO_DAC 53     // DAC output pin, siehe pins_arduino.h, entspricht A3 (P14.8)
+#define TEST_PIN_ANALOG_IO_DAC_INPUT A3
+
+#define ADC_RESOLUTION 1023 // 10-bit ADC resolution
+
+#endif // TEST_CONFIG_H